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Apples Defect Detection on NUV Imaging

Our **Apple Defect Detection System** uses **Near Ultraviolet (NUV) Imaging** to reveal hidden defects, such as bruises and blemishes, beneath the apple’s surface. By leveraging NUV light, we capture high-contrast images that highlight imperfections invisible to the human eye. 

The system integrates advanced image processing and AI-driven classification algorithms to detect and categorize defects in real time. This non-invasive, high-speed technology ensures accurate quality control, making it ideal for industrial-scale sorting and helping deliver only the best apples to consumers.

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